Title :
Development of a three-dimensional electron microscope for stereoscopic observation of nano-structures
Author_Institution :
Central Res. Lab., Hitachi Ltd., Tokyo, Japan
Abstract :
Stereoscopic observation of nanostructures is one of the ultimate goals in the analytical technology field. Three-dimensional (3D) structures and elemental bonding states in the nanometer area affect the function and performance of new materials and advanced devices. Thus, their evaluation at high resolution and high accuracy becomes very important. We have developed a high performance 3D electron microscope solving those issues. The goals were a 3D resolution of 0.5 nm and an energy resolution of 0.5 eV in electron energy loss spectroscopy. Various technologies to achieve those goals were developed and integrated as a 3D electron microscope system.
Keywords :
electron energy loss spectra; electron microscopes; nanostructured materials; 0.5 nm; 3D resolution; electron energy loss spectroscopy; nanostructures; stereoscopic observation; three-dimensional electron microscopy; Bonding; Chemical technology; Computed tomography; Electron microscopy; Energy loss; Energy resolution; Image reconstruction; Laboratories; Nanoscale devices; Spectroscopy;
Conference_Titel :
Microprocesses and Nanotechnology Conference, 2003. Digest of Papers. 2003 International
Conference_Location :
Tokyo, Japan
Print_ISBN :
4-89114-040-2
DOI :
10.1109/IMNC.2003.1268767