Title :
Experimental setup for measuring the local temperature of active electronic components
Author :
Dhokkar, Sonia ; Lagonotte, Patrick ; Blondel, Gael ; Masson, Philippe ; Matt, Jean-claude ; Piteau, Andre
Abstract :
A novel non-destructive and non-contacting technique for the local temperature measurement of heat spot in electronic component is presented. Highly-sensitive lock-in near infrared (NIR) thermography is used to localize the heat spot induced temperature variations down to 10-1°C at a lateral resolution down to 3 μm. Speedy temperature evolution about 10 microseconds can be followed as using an integral InGaAs PIN photodiode assembled with the matched preamplifier.
Keywords :
Calibration; Electronic components; Infrared heating; Microelectronics; Optical microscopy; Probes; Radiometry; Spatial resolution; Steady-state; Temperature measurement;
Conference_Titel :
Power Electronics and Applications, 2007 European Conference on
Conference_Location :
Aalborg, Denmark
Print_ISBN :
978-92-75815-10-8
Electronic_ISBN :
978-92-75815-10-8
DOI :
10.1109/EPE.2007.4417384
