Title :
A Naive-Bayes approach to Bolstered error estimation in high-dimensional spaces
Author :
Xingde Jiang ; Braga-Neto, Ulisses
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas A&M Univ., College Station, TX, USA
Abstract :
Bolstered error estimation has been shown to perform better than cross-validation and competitively with bootstrap in small-sample settings. However, its performance can deteriorate in the high-dimensional settings prevalent in Genomic Signal Processing. We propose here a modification of Bolstered error estimation that is based on the principle of Naive Bayes. Rather than attempting to estimate a single variance parameter for a spherical bolstering kernel in high-dimensional spaces from a small sample, we assume an ellipsoidal kernel and estimate each univariate variance separately along each variable. In simulation results based on a model for gene-expression data and a linear SVM classification rule, the new bolstered estimator clearly outperformed the old one, as well as cross-validation and resubstitution, and was also superior to the 0.632 bootstrap except in the case where a large feature set is selected.
Keywords :
Bayes methods; biology computing; estimation theory; feature selection; genetics; genomics; parameter estimation; pattern classification; support vector machines; Naive-Bayes approach; bolstered error estimation; ellipsoidal kernel; feature set selection; gene-expression data; genomic signal processing; high-dimensional spaces; linear SVM classification rule; single variance parameter estimation; spherical bolstering kernel; univariate variance estimation; Bioinformatics; Data models; Error analysis; Genomics; Kernel; Tin; Training; Bolstering; Bootstrap; Cross-validation; Error estimation; Support Vector Machines;
Conference_Titel :
Signal and Information Processing (GlobalSIP), 2014 IEEE Global Conference on
Conference_Location :
Atlanta, GA
DOI :
10.1109/GlobalSIP.2014.7032357