Application of flash memory for use in low earth orbit

Author

Park, Hyeong ; Anderson, Eric

Author_Institution

SEAKR Eng., Englewood, CO, USA

fYear

1996

fDate

24-26 Jun 1996

Firstpage

141

Abstract

Summary form only given. SEAKR engineering has developed a non-volatile solid state recorder for NASA Goddard Space Flight Center. Review of available NV memory technologies at the time (1994) showed that semiconductor flash memory provided the best mixture of density, availability, reliability, and radiation tolerance. A Gbit recorder was delivered to NASA GSFC in June 1995 and will orbit in April 1996 on STS-77´s Spartan Satellite mission. The authors present a memory trade study, rationale for selection of flash, radiation test results and orbital flight status

Keywords

integrated circuit reliability; integrated circuit testing; integrated memory circuits; radiation hardening (electronics); space vehicle electronics; NASA Goddard Space Flight Center; SEAKR engineering; STS-77 Spartan Satellite mission; availability; density; flash memory; low earth orbit; nonvolatile solid state recorder; orbital flight status; radiation test results; radiation tolerance; reliability; semiconductor flash memory; Aerospace engineering; Availability; Flash memory; Low earth orbit satellites; NASA; Nonvolatile memory; Reliability engineering; Semiconductor device reliability; Solid state circuits; Space technology;

fLanguage

English

Publisher

ieee

Conference_Titel

Nonvolatile Memory Technology Conference, 1996., Sixth Biennial IEEE International

Conference_Location

Albuquerque, NM

Print_ISBN

0-7803-3510-4

Type

conf

DOI

10.1109/NVMT.1996.534689

Filename

534689