Title :
Application of flash memory for use in low earth orbit
Author :
Park, Hyeong ; Anderson, Eric
Author_Institution :
SEAKR Eng., Englewood, CO, USA
Abstract :
Summary form only given. SEAKR engineering has developed a non-volatile solid state recorder for NASA Goddard Space Flight Center. Review of available NV memory technologies at the time (1994) showed that semiconductor flash memory provided the best mixture of density, availability, reliability, and radiation tolerance. A Gbit recorder was delivered to NASA GSFC in June 1995 and will orbit in April 1996 on STS-77´s Spartan Satellite mission. The authors present a memory trade study, rationale for selection of flash, radiation test results and orbital flight status
Keywords :
integrated circuit reliability; integrated circuit testing; integrated memory circuits; radiation hardening (electronics); space vehicle electronics; NASA Goddard Space Flight Center; SEAKR engineering; STS-77 Spartan Satellite mission; availability; density; flash memory; low earth orbit; nonvolatile solid state recorder; orbital flight status; radiation test results; radiation tolerance; reliability; semiconductor flash memory; Aerospace engineering; Availability; Flash memory; Low earth orbit satellites; NASA; Nonvolatile memory; Reliability engineering; Semiconductor device reliability; Solid state circuits; Space technology;
Conference_Titel :
Nonvolatile Memory Technology Conference, 1996., Sixth Biennial IEEE International
Conference_Location :
Albuquerque, NM
Print_ISBN :
0-7803-3510-4
DOI :
10.1109/NVMT.1996.534689
