Best Paper Awards

Each year the Design, Automation and Test in Europe Conference presents awards to the authors of the most outstanding papers of the previous year\´s conference. The selection is performed by an award committee, based on the results of the reviewing process, the quality of the final paper and the quality of the presentation. The paper selected as the most outstanding in the field of CAD (track A) is: "Exploiting the Routing Flexibility for Energy/Performance Aware Mapping of Regular NoC Architectures" by Jingcao Ju and Radu Marculescu of Carnegie Mellon University, USA. The paper selected as the most outstanding in the field of Tools (track B) is: "Validating SAT Solvers Using an Independent Resolution-Based Checker: Practical Implementations and Other Applications" by Lintao Zhang and Sharad Malik of Princeton University, USA. The paper selected as the most outstanding in the field of Test (track C) is: "Delay Defect Diagnosis Based Upon Statistical Timing Models - The First Step" by Angela Krstic, Li-C Wang and Kwang-Ting (Tim) Cheng of UC Santa Barbara, USA and Jing-Jia Liou of the National Tsing-Hua University, Taiwan, and Magdy S Abadir, Motorola Inc, USA.Each year the Design, Automation and Test in Europe Conference presents awards to the authors of the most outstanding papers of the previous year\´s conference. The selection is performed by an award committee, based on the results of the reviewing process, the quality of the final paper and the quality of the presentation. The paper selected as the most outstanding in the field of CAD (track A) is: "Exploiting the Routing Flexibility for Energy/Performance Aware Mapping of Regular NoC Architectures" by Jingcao Ju and Radu Marculescu of Carnegie Mellon University, USA. The paper selected as the most outstanding in the field of Tools (track B) is: "Validating SAT Solvers Using an Independent Resolution-Based Checker: Practical Implementations and Other Applications" by Lintao Zhang and Sharad Malik of Princeton- University, USA. The paper selected as the most outstanding in the field of Test (track C) is: "Delay Defect Diagnosis Based Upon Statistical Timing Models - The First Step" by Angela Krstic, Li-C Wang and Kwang-Ting (Tim) Cheng of UC Santa Barbara, USA and Jing-Jia Liou of the National Tsing-Hua University, Taiwan, and Magdy S. Abadir, Motorola Inc, USA.