DocumentCode
2582211
Title
State-preserving vs. non-state-preserving leakage control in caches
Author
Li, Yingmin ; Parikh, Dharmesh ; Zhang, Yan ; Sankaranarayanan, Karthik ; Stan, Mircea ; Skadron, Kevin
Author_Institution
Dept. of Comput. Sci., Virginia Univ., Charlottesville, VA, USA
Volume
1
fYear
2004
fDate
16-20 Feb. 2004
Firstpage
22
Abstract
This paper compares the effectiveness of state-preserving and non-state-preserving techniques for leakage control in caches by comparing drowsy cache and gated-Vss for data caches using 70nm technology parameters. To perform the comparison, we introduce "HotLeakage", a new architectural model for subthreshold and gate leakage that explicitly models the effects of temperature, voltage, and parameter variations, and has the ability to recalculate leakage currents dynamically as temperature and voltage change at runtime due to operating conditions, DVS techniques, etc. By comparing drowsy-cache and gated-Vss at different L2 latencies and different gate oxide thickness values, we are able to identify a range of operating parameters at which gated-Vss is more energy efficient than drowsy-cache, even though gated-Vss does not preserve data in cache lines that have been deactivated. We are also able to show potential further benefits of gated-Vss if an effective dynamic adaptation technique can be found. These results debunk a fairly widespread belief that state-preserving techniques are inherently superior to non-state-preserving techniques.
Keywords
cache storage; electric current control; leakage currents; memory architecture; 70 nm; DVS techniques; HotLeakage; cache lines; data caches; drowsy cache; dynamic adaptation technique; gate leakage; gate oxide thickness; gated-Vss; nonstate-preserving leakage control; operating conditions; parameter variations; state-preserving leakage control; subthreshold; CMOS technology; Gate leakage; Leakage current; Power dissipation; Power generation; Power semiconductor switches; Runtime; Switching circuits; Temperature; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
ISSN
1530-1591
Print_ISBN
0-7695-2085-5
Type
conf
DOI
10.1109/DATE.2004.1268822
Filename
1268822
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