• DocumentCode
    2582229
  • Title

    Automatic configuration of random access channel parameters in LTE systems

  • Author

    Choi, Seunghyun ; Lee, Wonbo ; Kim, Dongmyoung ; Park, Kyung-joon ; Choi, Sunghyun ; Han, Ki-Young

  • Author_Institution
    Sch. of Electr. Eng., Seoul Nat. Univ., Seoul, South Korea
  • fYear
    2011
  • fDate
    10-12 Oct. 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    In 3G long term evolution (LTE) systems, the random access channel (RACH) is used for initial access, resource request, and handover. Since the random access delay is determined by the arrival rate of the random access preambles and the number of RACH subframes, we should configure the number of RACH subframes given the arrival rate in order to guarantee the delay performance. In this work, by carefully taking account of a tradeoff between the number of RACH subframes and the random access delay, we present an optimization formulation that minimizes the number of RACH subframes for a given delay requirement. Furthermore, since the arrival rate of the random access preambles is time varying in reality, we further propose an estimation scheme for the arrival rate by reflecting the periodicity and the correlation between recent and future arrival rates. Our simulation results show that the proposed scheme for tuning the RACH subframes gives very promising network performance under time-varying environments.
  • Keywords
    3G mobile communication; Long Term Evolution; delays; estimation theory; mobility management (mobile radio); optimisation; wireless channels; 3G LTE system; 3G Long Term Evolution system; RACH parameter subframe; automatic configuration; estimation scheme; handover; optimization formulation; random access channel parameter subframe; random access delay performance; resource request; time-varying environment; Data communication; Data models; Delay; Estimation; Humans; IEEE 802.11 Standards; Optimization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wireless Days (WD), 2011 IFIP
  • Conference_Location
    Niagara Falls, ON
  • ISSN
    2156-9711
  • Print_ISBN
    978-1-4577-2027-7
  • Electronic_ISBN
    2156-9711
  • Type

    conf

  • DOI
    10.1109/WD.2011.6098212
  • Filename
    6098212