• DocumentCode
    2582548
  • Title

    A first-order mechanistic model for architectural vulnerability factor

  • Author

    Nair, Arun Arvind ; Eyerman, Stijn ; Eeckhout, Lieven ; John, Lizy Kurian

  • Author_Institution
    Univ. of Texas at Austin, Austin, TX, USA
  • fYear
    2012
  • fDate
    9-13 June 2012
  • Firstpage
    273
  • Lastpage
    284
  • Abstract
    Soft error reliability has become a first-order design criterion for modern microprocessors. Architectural Vulnerability Factor (AVF) modeling is often used to capture the probability that a radiation-induced fault in a hardware structure will manifest as an error at the program output. AVF estimation requires detailed microarchitectural simulations which are time-consuming and typically present aggregate metrics. Moreover, it requires a large number of simulations to derive insight into the impact of microarchitectural events on AVF. In this work we present a first-order mechanistic analytical model for computing AVF by estimating the occupancy of correct-path state in important microarchitecture structures through inexpensive profiling. We show that the model estimates the AVF for the reorder buffer, issue queue, load and store queue, and functional units in a 4-wide issue machine with a mean absolute error of less than 0.07. The model is constructed from the first principles of out-of-order processor execution in order to provide novel insight into the interaction of the workload with the microarchitecture to determine AVF. We demonstrate that the model can be used to perform design space explorations to understand trade-offs between soft error rate and performance, to study the impact of scaling of microarchitectural structures on AVF and performance, and to characterize workloads for AVF.
  • Keywords
    integrated circuit design; microprocessor chips; radiation effects; architectural vulnerability factor; correct-path state; design space exploration; first-order design criterion; first-order mechanistic analytical model; first-order mechanistic model; microarchitectural simulations; microarchitecture structures; modern microprocessors; out-of-order processor execution; radiation-induced fault; soft error reliability; Analytical models; Computational modeling; Load modeling; Mathematical model; Microarchitecture; Pipelines; Steady-state;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Architecture (ISCA), 2012 39th Annual International Symposium on
  • Conference_Location
    Portland, OR
  • ISSN
    1063-6897
  • Print_ISBN
    978-1-4673-0475-7
  • Electronic_ISBN
    1063-6897
  • Type

    conf

  • DOI
    10.1109/ISCA.2012.6237024
  • Filename
    6237024