• DocumentCode
    2582629
  • Title

    On the detectability of parametric faults in analog circuits

  • Author

    Savir, Jacob ; Guo, Zhen

  • Author_Institution
    Dept. of Electr. & Comput. Eng., New Jersey Inst. of Technol., Newark, NJ, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    273
  • Lastpage
    276
  • Abstract
    This paper investigates the detectability of parameter faults in linear, time-invariant, analog circuits. We show that there are inherent limitations with regard to analog fault detectability.
  • Keywords
    analogue circuits; circuit testing; fault diagnosis; linear network analysis; linear time-invariant analog circuits; parametric fault detectability; Analog circuits; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Jacobian matrices; Performance evaluation; Pins; Space technology; Transfer functions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design: VLSI in Computers and Processors, 2002. Proceedings. 2002 IEEE International Conference on
  • ISSN
    1063-6404
  • Print_ISBN
    0-7695-1700-5
  • Type

    conf

  • DOI
    10.1109/ICCD.2002.1106781
  • Filename
    1106781
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2582629