Title :
A differential high-speed digital CMOS buffer with hysteresis for improved noise immunity
Author :
Secareanu, Rasu M. ; Friedman, Eby G.
Author_Institution :
Dept. of Electr. & Comput. Eng., Rochester Univ., NY, USA
Abstract :
A digital CMOS buffer circuit with a voltage transfer characteristic (VTC) with low threshold voltages, hysteresis, and high noise immunity is presented. The circuit is capable of restoring slow transition times and distorted input signals with a minimum delay penalty, offering high noise immunity to glitches induced either through capacitive coupling or from the power supply lines such as simultaneous switching noise (SSN). The high noise immunity of the proposed buffer circuit is achieved using a differential redundant circuit architecture
Keywords :
CMOS digital integrated circuits; buffer circuits; high-speed integrated circuits; hysteresis; integrated circuit noise; redundancy; capacitive coupling; differential CMOS buffer; differential redundant circuit architecture; high-speed digital CMOS buffer; hysteresis; low threshold voltages; noise immunity; power supply line glitches; simultaneous switching noise; voltage transfer characteristic; CMOS digital integrated circuits; Circuit noise; Coupling circuits; Delay; Distortion; Hysteresis; Power supplies; Signal restoration; Switching circuits; Threshold voltage;
Conference_Titel :
ASIC/SOC Conference, 2000. Proceedings. 13th Annual IEEE International
Conference_Location :
Arlington, VA
Print_ISBN :
0-7803-6598-4
DOI :
10.1109/ASIC.2000.880758