Capturing input switching dependency in crosstalk noise modeling

Simulations of CMOS circuits for different input switching conditions reveal that the peak crosstalk noise can differ significantly for a given circuit structure with specific technology parameters and specific signal transition times. We show that these effects can be captured by appropriate victim driver modeling and we propose a systematic method to find the equivalent resistances for different switching conditions. In 0.25 /spl mu/m technology, the maximum error of our linear model with respect to HSpice simulation using the nonlinear driver model is less than 5%, and the average error is less than 2%.