• DocumentCode
    2582828
  • Title

    Bulk resistance decay in CdTe

  • Author

    Andreev, Alexey ; Grmela, Lubomir ; Sikula, Josef ; Chvatal, Milos ; Raska, Michal

  • Author_Institution
    Dept. of Phys., Brno Univ. of Technol., Brno, Czech Republic
  • fYear
    2009
  • fDate
    18-23 May 2009
  • Firstpage
    1176
  • Lastpage
    1179
  • Abstract
    Bulk resistance decay of cadmium telluride (CdTe) single crystals was investigated. The bulk resistance of each CdTe single crystal was measured during long time interval. The samples were placed into a cryostat. That allowed us to hold the temperature constant during the measurements and eliminate the illumination influence. The measurements started and were continued at 300 K and after some period of time it was sharply raised up to 390 K. We observed the resistance slow decreasing with time with temperature T = 300 K and T = 390 K. All the samples have very high value of relaxation time. The presented samples must have not one but four acceptor or donor levels, some of them are deep levels. We have discovered that the interactions between the valence band and deep acceptor levels or between the conductivity band and deep donor levels cause this long value of relaxation time.
  • Keywords
    cadmium compounds; cryostats; electrical conductivity; electrical resistivity; ternary semiconductors; valence bands; CdTe; bulk resistance decay; cadmium telluride single crystals; conductivity band; cryostat; deep acceptor; deep donor levels; relaxation time; temperature 300 K to 390 K; valence band; Cadmium compounds; Conductivity; Crystals; Current measurement; Detectors; Electric resistance; Electrical resistance measurement; Physics; Temperature; Time measurement; CdTe single crystal; deep level defects; relaxation process;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    EUROCON 2009, EUROCON '09. IEEE
  • Conference_Location
    St.-Petersburg
  • Print_ISBN
    978-1-4244-3860-0
  • Electronic_ISBN
    978-1-4244-3861-7
  • Type

    conf

  • DOI
    10.1109/EURCON.2009.5167785
  • Filename
    5167785