DocumentCode
2582828
Title
Bulk resistance decay in CdTe
Author
Andreev, Alexey ; Grmela, Lubomir ; Sikula, Josef ; Chvatal, Milos ; Raska, Michal
Author_Institution
Dept. of Phys., Brno Univ. of Technol., Brno, Czech Republic
fYear
2009
fDate
18-23 May 2009
Firstpage
1176
Lastpage
1179
Abstract
Bulk resistance decay of cadmium telluride (CdTe) single crystals was investigated. The bulk resistance of each CdTe single crystal was measured during long time interval. The samples were placed into a cryostat. That allowed us to hold the temperature constant during the measurements and eliminate the illumination influence. The measurements started and were continued at 300 K and after some period of time it was sharply raised up to 390 K. We observed the resistance slow decreasing with time with temperature T = 300 K and T = 390 K. All the samples have very high value of relaxation time. The presented samples must have not one but four acceptor or donor levels, some of them are deep levels. We have discovered that the interactions between the valence band and deep acceptor levels or between the conductivity band and deep donor levels cause this long value of relaxation time.
Keywords
cadmium compounds; cryostats; electrical conductivity; electrical resistivity; ternary semiconductors; valence bands; CdTe; bulk resistance decay; cadmium telluride single crystals; conductivity band; cryostat; deep acceptor; deep donor levels; relaxation time; temperature 300 K to 390 K; valence band; Cadmium compounds; Conductivity; Crystals; Current measurement; Detectors; Electric resistance; Electrical resistance measurement; Physics; Temperature; Time measurement; CdTe single crystal; deep level defects; relaxation process;
fLanguage
English
Publisher
ieee
Conference_Titel
EUROCON 2009, EUROCON '09. IEEE
Conference_Location
St.-Petersburg
Print_ISBN
978-1-4244-3860-0
Electronic_ISBN
978-1-4244-3861-7
Type
conf
DOI
10.1109/EURCON.2009.5167785
Filename
5167785
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