• DocumentCode
    2582870
  • Title

    Efficient LDMOS device operation for envelope tracking amplifiers through second harmonic manipulation

  • Author

    Alavi, Morteza S. ; Van Rijs, Fred ; Marchetti, Mauro ; Squillante, Michele ; Zhang, Tao ; Theeuwen, Steven J C H ; Volokhine, Yuri ; Jos, H.F.F. ; Heijden, Mark P v d ; Acar, Mustafa ; De Vreede, Leo C N

  • Author_Institution
    Tech. Univ. Delft, Delft, Netherlands
  • fYear
    2011
  • fDate
    5-10 June 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this work efficient LDMOS device operation for envelope tracking amplifier systems is discussed. Utilizing the voltage dependence of Cds in combination with a well chosen 2nd harmonic output termination, a “hybrid” combination of class-J* and class-B device operation is defined, which yields improved efficiency at low supply voltages in power back-off, while avoiding device breakdown when operating at high supply voltages. Using these techniques with a Gen7 NXP 2W LDMOS device in a load-pull test bench, more than 63% drain efficiency over a 10 dB power back-off range is achieved at 2.14 GHz. The proposed method is supported by simulations and measurements and is directly applicable to envelope tracking power amplifiers.
  • Keywords
    MIS devices; UHF amplifiers; code division multiple access; semiconductor device breakdown; 2nd harmonic output termination; Gen7 NXP 2W LDMOS device; LDMOS device operation; W-CDMA; class-B device operation; class-J* device operation; device breakdown; drain efficiency; envelope tracking amplifiers; load-pull test bench; power back-off; second harmonic manipulation; Harmonic analysis; Loading; Multiaccess communication; Peak to average power ratio; Power amplifiers; Power generation; Voltage measurement; Class-B; Class-J; Envelope Tracking; Load Pull; Power amplifier (PA);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International
  • Conference_Location
    Baltimore, MD
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-61284-754-2
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2011.5972665
  • Filename
    5972665