• DocumentCode
    2582967
  • Title

    Fast exploration of parameterized bus architecture for communication-centric SoC design

  • Author

    Shin, Chulho ; Kim, Young-Taek ; Chung, Eui-Young ; Choi, Kyu-Myung ; Kong, Jeong-Taek ; Eo, Soo-Kwan

  • Author_Institution
    CAE Center, Samsung Electron. Co. Ltd., Seoul, South Korea
  • Volume
    1
  • fYear
    2004
  • fDate
    16-20 Feb. 2004
  • Firstpage
    352
  • Abstract
    For successful SoC design, efficient and scalable communication architecture is crucial. Some bus interconnects now provide configurable structures to meet this requirement of an SoC design. Furthermore, bus IP vendors provide software tools that automatically generate RTL codes of a bus once its designer configures it. Configurability, however, imposes more challenges upon designers because complexity involved in optimization increases exponentially as the number of parameters grows. In this paper, we present a novel approach with which effort requirement can be dramatically reduced. An automated optimization tool we developed is used and it exploits a genetic algorithm for fast design exploration. This paper shows that the time for the optimizing task can be reduced by more than 90% when the tool is used and, more significantly the task can be done without an expert´s hand while ending up with a better solution.
  • Keywords
    circuit optimisation; genetic algorithms; integrated circuit design; integrated circuit interconnections; system buses; system-on-chip; RTL codes; bus configuration; bus interconnects; circuit optimization; communication architecture; communication-centric SoC design; configurable structures; genetic algorithm; parameterized bus architecture; platform-based design; software tools; Automatic testing; Computer aided engineering; Control systems; Design automation; Graphics; Master-slave; Power system interconnection; Space exploration; System testing; Topology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-2085-5
  • Type

    conf

  • DOI
    10.1109/DATE.2004.1268872
  • Filename
    1268872