DocumentCode
2583240
Title
Fault dictionary size reduction through test response superposition
Author
Arslan, Baris ; Orailoglu, Alex
Author_Institution
Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA
fYear
2002
fDate
2002
Firstpage
480
Lastpage
485
Abstract
The exceedingly large size of fault dictionaries constitutes a fundamental obstacle to their usage. We outline a new method to reduce significantly, the size of fault dictionaries. The proposed method partitions the test set and a combined signature is stored for each partition. The new approach aims to provide high diagnostic resolution with a small number of combined signatures. The experimental results show a considerable decrease in the storage requirement of fault dictionaries.
Keywords
fault diagnosis; logic testing; fault dictionary size reduction; signature analysis; storage requirement; test response superposition; Circuit faults; Circuit testing; Computer science; Dictionaries; Fault diagnosis; Fault location; Manufacturing processes; Production; Test pattern generators; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Design: VLSI in Computers and Processors, 2002. Proceedings. 2002 IEEE International Conference on
ISSN
1063-6404
Print_ISBN
0-7695-1700-5
Type
conf
DOI
10.1109/ICCD.2002.1106817
Filename
1106817
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