• DocumentCode
    2583240
  • Title

    Fault dictionary size reduction through test response superposition

  • Author

    Arslan, Baris ; Orailoglu, Alex

  • Author_Institution
    Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    480
  • Lastpage
    485
  • Abstract
    The exceedingly large size of fault dictionaries constitutes a fundamental obstacle to their usage. We outline a new method to reduce significantly, the size of fault dictionaries. The proposed method partitions the test set and a combined signature is stored for each partition. The new approach aims to provide high diagnostic resolution with a small number of combined signatures. The experimental results show a considerable decrease in the storage requirement of fault dictionaries.
  • Keywords
    fault diagnosis; logic testing; fault dictionary size reduction; signature analysis; storage requirement; test response superposition; Circuit faults; Circuit testing; Computer science; Dictionaries; Fault diagnosis; Fault location; Manufacturing processes; Production; Test pattern generators; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design: VLSI in Computers and Processors, 2002. Proceedings. 2002 IEEE International Conference on
  • ISSN
    1063-6404
  • Print_ISBN
    0-7695-1700-5
  • Type

    conf

  • DOI
    10.1109/ICCD.2002.1106817
  • Filename
    1106817