DocumentCode :
2583508
Title :
Integration of Knowledge Discovery techniques in the Quality Management model to achieve higher target quality
Author :
Ansari Ch, F. ; Sassenberg, Christian ; Fathi, Madjid ; Montino, Ralf
Author_Institution :
Univ. of Siegen, Siegen, Germany
fYear :
2009
fDate :
22-25 Sept. 2009
Firstpage :
1
Lastpage :
6
Abstract :
Improving the quality of products is an important issue in the modern business world. Traditional approaches of Quality Management (QM) are not adequate to fulfil the demands on target quality of products. This study reveals that synergetic approaches based on the integration of Knowledge Management (KM) in Total Quality Management (TQM) have a direct impact on enhancing the quality of products. We also propose a management model to synthesize elements of both methodologies under an integrative framework. Furthermore, Knowledge Discovery in Databases (KDD) is introduced to realize the effectiveness of the proposed management model and to illustrate the influence of this synergetic approach taking the semiconductor industry as exemplary field of application.
Keywords :
data mining; database management systems; quality management; databases; knowledge discovery techniques; knowledge management; quality management model; semiconductor industry; target quality; Costs; Customer satisfaction; Databases; Electronics industry; Knowledge management; Manufacturing; Production; Quality management; Supply chains; Total quality management;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Emerging Technologies & Factory Automation, 2009. ETFA 2009. IEEE Conference on
Conference_Location :
Mallorca
ISSN :
1946-0759
Print_ISBN :
978-1-4244-2727-7
Electronic_ISBN :
1946-0759
Type :
conf
DOI :
10.1109/ETFA.2009.5347032
Filename :
5347032
Link To Document :
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