DocumentCode :
2583524
Title :
Extraction of schematic array models for memory circuits
Author :
Bose, Soumita ; Nandi, Amit
Author_Institution :
Test Technol. Group, Intel Corp., Folsom, CA, USA
Volume :
1
fYear :
2004
fDate :
16-20 Feb. 2004
Firstpage :
570
Abstract :
The modeling and simulation of memory circuits remains an outstanding problem when accuracy with respect to the actual schematic implementation is desired. Functionally equivalent RTL models often cannot be used for designs with embedded memory blocks, because schematic models for the surrounding logic may be required for fault modeling accuracy. Existing methods derive a latch model that essentially represents each memory location as a latch primitive, and have a large number of gates. We present new algorithms that model such circuits as decoded arrays that access entire rows of cells for individual read and write operations. Decoded array models allow fault modeling accuracy for the surrounding logic, including the memory address decoder. Experimental data show improvements of an order of magnitude for both logic and fault simulations, when compared to the equivalent latch model.
Keywords :
digital simulation; fault simulation; formal verification; logic design; logic simulation; memory architecture; ATPG; CCSN; RTL models; channel connected subnetworks; decoded arrays; embedded memory blocks; extracted gate level models; fault modeling accuracy; fault simulation; fault simulations; formal verification; latch model; logic simulations; memory address decoder; memory circuits; memory location; read operations; schematic array model extraction; surrounding logic; test generation; write operations; Automatic testing; Circuit testing; Design automation; Europe;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
ISSN :
1530-1591
Print_ISBN :
0-7695-2085-5
Type :
conf
DOI :
10.1109/DATE.2004.1268906
Filename :
1268906
Link To Document :
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