Title :
New analysis techniques and waveform displaying for intracranial pressure data
Author :
Flick, B.B. ; Orglmeister, R. ; Köhler, B. ; Zietz, H.-J. ; Chastrusse, V. ; Berger, J.-M. ; Samii, M.
Author_Institution :
SICAN F&E GmbH, Hannover, Germany
fDate :
29 Oct-1 Nov 1998
Abstract :
This paper describes a new data analysis technique for the computation of important brain parameters from intracranial pressure (ICP) data. In contrast to conventional methods, our method does not need the additional infusion of liquor into the brain. Our new technique is able to achieve the requested parameters only from natural fluctuations within the intracranial pressure signal. The advantage of our method is the minimisation of the risk for the patient. Furthermore, the proposed technique is much more comfortable for patients than the conventional methods. For the data acquisition a portable telemetric measurement unit will be used. Plausible Results from real data show that our method is highly efficient. Due to its simplicity our method is suitable for on-line monitoring applications. This new measuring system could also be implemented in other fields where telemetric sensors are needed and biological signals up to the 50 Hz-range are measured
Keywords :
biomedical telemetry; biomedical transducers; brain; computerised monitoring; data acquisition; medical signal processing; patient monitoring; pressure sensors; spectral analysis; time-frequency analysis; automatic event recording; brain parameters; cerebrospinal fluid; compliance; data acquisition; data analysis technique; intracranial pressure data; natural fluctuations; on-line monitoring; patient risk minimisation; plateau waves; portable telemetric measurement unit; resorption; time frequency analysis; waveform display; Biosensors; Cranial pressure; Data acquisition; Data analysis; Fluctuations; Measurement units; Minimization methods; Patient monitoring; Sensor systems; Telemetry;
Conference_Titel :
Engineering in Medicine and Biology Society, 1998. Proceedings of the 20th Annual International Conference of the IEEE
Conference_Location :
Hong Kong
Print_ISBN :
0-7803-5164-9
DOI :
10.1109/IEMBS.1998.747173