Title :
An accurate packaged model for HVHBT 120W power amplifiers and its application to 250W Doherty amplifiers
Author :
Zhang, Xiangkun ; Chau, Frank ; Lin, Barry
Author_Institution :
TriQuint Semicond., San Jose, CA, USA
Abstract :
An accurate yet straightforward modeling approach is reported to develop a packaged model for InGaP/GaAs HVHBT 120 W power amplifiers (PA) at 2140 MHz. The model consists of an accurate HBT model, models for internal pre-match circuits and models for coupled bond-wire arrays. The HBT model is scaled up from an AHBT (Agilent HBT) model for a unit cell transistor. The models for the internal pre-match circuits are lumped-element equivalent circuit models derived from the EM simulated S-parameters. For high power amplifiers, the coupling between the bond-wires must be accounted for. In this work, the coupling between the bond-wires is determined up to the 4th next bond-wires. The model of 120 W PA can precisely simulate small signal S-parameters as well as large signal performances of harmonic load-pull power sweep, such as output power, P1dB, G1dB, efficiency and operation current. A very good agreement between simulation and measurement has been achieved. The model is then applied to simulate a 250 W symmetric Doherty amplifier with an efficiency above 70%. The results of simulation agrees well with the measurement. The difference in efficiency between simulation and measurement is only 1.6%.
Keywords :
III-V semiconductors; S-parameters; UHF field effect transistors; UHF power amplifiers; electronics packaging; equivalent circuits; gallium arsenide; heterojunction bipolar transistors; indium compounds; semiconductor device models; wide band gap semiconductors; Agilent HBT model; Doherty amplifiers; EM simulated S-parameters; HVHBT; InGaP-GaAs; accurate packaged model; coupled bond-wire arrays; frequency 2140 MHz; high power amplifiers; internal prematch circuits; lumped-element equivalent circuit models; power 120 W; power 250 W; power amplifiers; small signal S-parameters; unit cell transistor; Current measurement; Gain; Heterojunction bipolar transistors; Integrated circuit modeling; Load modeling; Power amplifiers; Semiconductor device modeling; AHBT model; Doherty amplifiers; GaAs HVHBT; HBT models; power amplifiers; semiconductor device modeling;
Conference_Titel :
Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-61284-754-2
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2011.5972720