DocumentCode :
2583667
Title :
Characterization and modeling of silicon carbide power devices and paralleling operation
Author :
Cui, Yutian ; Chinthavali, Madhu S. ; Xu, Fan ; Tolbert, Leon M.
Author_Institution :
Univ. of Tennessee, Knoxville, TN, USA
fYear :
2012
fDate :
28-31 May 2012
Firstpage :
228
Lastpage :
233
Abstract :
This paper presents recent research on several silicon carbide (SiC) power devices. The devices have been tested for both static and dynamic characteristics, which show the advantages over their Si counterparts. The temperature dependency of these characteristics has also been presented in this paper. Then, simulation work of paralleling operation of SiC power MOSFETs based on a verified device model in Pspice is presented to show the impact of parasitics in the circuit on the switching performance.
Keywords :
SPICE; power MOSFET; silicon compounds; PSPICE; SiC; SiC power MOSFET; modeling; paralleling operation; parasitics; silicon carbide power devices; JFETs; Logic gates; MOSFETs; Resistance; Silicon carbide; Temperature; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics (ISIE), 2012 IEEE International Symposium on
Conference_Location :
Hangzhou
ISSN :
2163-5137
Print_ISBN :
978-1-4673-0159-6
Electronic_ISBN :
2163-5137
Type :
conf
DOI :
10.1109/ISIE.2012.6237089
Filename :
6237089
Link To Document :
بازگشت