DocumentCode :
2583747
Title :
Error control coding for semiconductor memory systems in the space radiation environment
Author :
Kaneko, Haruhiko
Author_Institution :
Inst. of Space Technol. & Aeronaut., Japan Aerosp. Exploration Agency, Tsukuba, Japan
fYear :
2005
fDate :
3-5 Oct. 2005
Firstpage :
93
Lastpage :
101
Abstract :
Error control coding is essential for semiconductor memory systems used in the space radiation environment because memory chips in this environment often suffer from single event upsets (SEUs). This paper presents the development of encoders and decoders of error control codes suitable for the space radiation environment. To select suitable error control codes, we analyze error patterns and error counts in in-flight data of a solid state recorder installed in the Mission Demonstration test Satellite-1 (MDS-1). Based on this analysis, six classes of linear error control codes are selected, and encoders and decoders of these codes are designed and implemented using an FPGA. To reduce the decoding delay, the decoders are designed based on a parallel decoding method. Evaluation of the implemented FPGA shows that the decoders have 45K to 300K gates with decoding delay of about 20 ns.
Keywords :
decoding; encoding; error correction codes; field programmable gate arrays; integrated memory circuits; radiation hardening (electronics); space vehicle electronics; FPGA system; Mission Demonstration test Satellite-1; decoder design; decoding delay reduction; encoder design; error control coding; error count analysis; error pattern analysis; linear error control codes; memory chips; parallel decoding method; semiconductor memory systems; single event upsets; solid state recorder; space radiation environment; Decoding; Delay; Error analysis; Error correction; Error correction codes; Field programmable gate arrays; Pattern analysis; Semiconductor memory; Single event transient; Single event upset;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2005. DFT 2005. 20th IEEE International Symposium on
ISSN :
1550-5774
Print_ISBN :
0-7695-2464-8
Type :
conf
DOI :
10.1109/DFTVS.2005.34
Filename :
1544507
Link To Document :
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