Title :
Prevalence and charaterization of carbapenem-resistant Pseudomonas aeruginosa carrying metallo-β-lactamases at different wards
Author :
Wen, Zhang Ruo ; Fan, Li ; Li, Chou Li ; Sha, Cui Sha ; Cheng, Li Ming
Author_Institution :
Dept. of Pathobiology, Jilin Univ., Changchun, China
Abstract :
This study was conducted to investigate the molecular occurrence and dissemination of Pseudomonas aeruginosa producing MBLs recovered from the different wards in the affiliated hospital, Jilin. Antibiotic susceptibility test was determined using standard agar diffusion in conjunction with MBL screening methods. Plasmid profiles and pulsed-field gel electrophoresis were used to study the relatedness of isolates. The total of 120 were isolated from three wards and 89 strains (74.8%) produced MBLs, the number of 31 strains (25.2%) didn´t produce MBLs. All MBLs isolates showed identical antimicrobial susceptibility profiles. Among P. aeruginosa producing MBLs, 79 strains (88.9%) were positive for blaVIM-2 gene, 12 strains (11.1%) contained blaIMP-3 gene, which were located on transferable plasmids with class 1 integron. All MBLs isolates were closely related by PFGE and plasmid analysis. This study confirmed the potential risk of dissemination of carbapenem-resistant Pseudomonas aeruginosa with inter-and intrahospital clonal transfer of patients.
Keywords :
biochemistry; biological techniques; chemical analysis; electrophoresis; microorganisms; molecular biophysics; organic compounds; PFGE; Pseudomonas aeruginosa; agar diffusion; antibiotic susceptibility test; antimicrobial susceptibility profiles; carbapenem resistant; class 1 integron; clonal transfer; metallo-β-lactamases; molecular occurrence; plasmid analysis; plasmid profiles; pulsed field gel electrophoresis; DNA; Hospitals; Immune system; Laboratories; Standards; Strain; Surgery; Metallo-β-lactamases; Pseudomonas aeruginosa; nosocomial infection;
Conference_Titel :
Biomedical Engineering and Informatics (BMEI), 2011 4th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-9351-7
DOI :
10.1109/BMEI.2011.6098317