Title :
Design & implementation of an A-type residual current circuit breaker IC
Author :
Yan Han ; Chen Ding ; Xinli Shou
Author_Institution :
Dept. of Inf. Sci.& Electron. Eng., Zhejiang Univ., Hangzhou, China
Abstract :
Nowadays, electrical equipments are becoming more and more complex in industrial production and people´s daily lives. The case that non-sinusoidal residual current appearing in the power grid is gradually increasing in modern society. However, the traditional AC-type leakage protector is insensitive to such residual current, and it cannot have an effective protection. So the A-type leakage protector which is more functional is becoming widely used. This paper introduces a new ASIC chip ZDAB01 for A-type leakage protector. This chip is designed and implemented in CSMC 0.5um Mixed CMOS process, and has completely independent intellectual property rights. Test results has confirmed that ZDAB01 performance meets the corresponding provisions of the national standard and has a strong anti-interference ability. The A-type leakage protector becomes more and more popular, and ZDAB01 chip will show great market prospects and social benefits.1.
Keywords :
CMOS integrated circuits; application specific integrated circuits; industrial property; integrated circuit design; leakage currents; power grids; residual current devices; A-type residual current circuit breaker IC; AC-type leakage protector; ASIC chip ZDAB01; CSMC mixed CMOS process; ZDAB01 chip design; ZDAB01 performance; antiinterference ability; daily lives; effective protection; electrical equipments; industrial production; intellectual property rights; market prospects; modern society; national standard; nonsinusoidal residual current; power grid; size 0.5 mum; social benefits; Clocks; Consumer electronics; Control systems; Frequency conversion; Integrated circuits; Leakage current; Standards; A-type leakage protector; ASIC; IC design; Residual pulsating DC; leakage current;
Conference_Titel :
Industrial Electronics (ISIE), 2012 IEEE International Symposium on
Conference_Location :
Hangzhou
Print_ISBN :
978-1-4673-0159-6
Electronic_ISBN :
2163-5137
DOI :
10.1109/ISIE.2012.6237098
