Title :
Combinatorial Test Generation for Software Product Lines Using Minimum Invalid Tuples
Author :
Linbin Yu ; Feng Duan ; Yu Lei ; Kacker, Raghu N. ; Kuhn, D. Rick
Author_Institution :
Dept. of Comput. Sci. & Eng., Univ. of Texas at Arlington, Arlington, TX, USA
Abstract :
A software product line is a set of software systems that share some common features. Several recent works have been reported that apply combinatorial testing, a very effective testing strategy, to software product lines. A unique challenge in these efforts is dealing with a potentially large number of constraints among different features. In this paper, we propose a novel constraint-handling strategy that uses minimum invalid tuples (MITs) as an alternative to traditional constraint solvers. Our approach systematically derives all MITs from a software product line, and uses them to quickly determine the validity of a test configuration during test generation. We implemented a test generation research tool called LOOKUP that integrates the proposed constraint-handling strategy with a general test generation algorithm called IPOG-C. Experimental results show that LOOKUP performs considerably better than two existing test generation tools in terms of test size and execution time.
Keywords :
combinatorial mathematics; constraint handling; program testing; software product lines; IPOG-C; LOOKUP test generation research tool; MITs; combinatorial test generation; constraint-handling strategy; general test generation algorithm; minimum invalid tuples; software product lines; software systems; test configuration; test size; Aircraft; Aircraft propulsion; Biological system modeling; Engines; Software systems; Testing; Combinatorial Testing; Constraint Handling; Feature Model;
Conference_Titel :
High-Assurance Systems Engineering (HASE), 2014 IEEE 15th International Symposium on
Conference_Location :
Miami Beach, FL
Print_ISBN :
978-1-4799-3465-2
DOI :
10.1109/HASE.2014.18