DocumentCode
2583917
Title
A novel approach for dielectric constant measurement using microwave oscillators
Author
Sekar, Vikram ; Torke, William J. ; Palermo, Samuel ; Entesari, Kamran
Author_Institution
Texas A&M Univ., College Station, TX, USA
fYear
2011
fDate
5-10 June 2011
Firstpage
1
Lastpage
4
Abstract
In this paper, planar microwave oscillators are used to measure the dielectric constant of organic liquids for the first time. Dielectric constant of an unknown material is calculated based on the change in oscillation frequency caused by the material-under-test (MUT). A split-ring resonator (SRR) is chosen as the sensing element due its small area and high confinement of electric fields which makes it sensitive to permittivity changes of the MUT above the SRR. A C-band microwave oscillator prototype is fabricated on RT/Duroid 5880 substrate and calibrated using ethanol and methanol as reference materials. The dielectric constant of small quantities (<; 20μL) of acetic acid, xylene, isobutanol and ethyl acetate are extracted from measurement of oscillation frequency shift and show good agreement with previously reported values.
Keywords
electric fields; frequency measurement; microwave oscillators; organic compounds; permittivity measurement; resonators; C-band microwave oscillator prototype; MUT; RT-Duroid 5880 substrate; SRR; dielectric constant measurement; electric fields; material-under-test; organic liquid; oscillation frequency; oscillation frequency measurement; planar microwave oscillator; split ring resonator; Dielectric constant; Dielectric measurements; Frequency measurement; Logic gates; Materials; Oscillators; Sensors; Permittivity measurement; microwave oscillator; split-ring resonator;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International
Conference_Location
Baltimore, MD
ISSN
0149-645X
Print_ISBN
978-1-61284-754-2
Electronic_ISBN
0149-645X
Type
conf
DOI
10.1109/MWSYM.2011.5972734
Filename
5972734
Link To Document