Title :
A novel approach for dielectric constant measurement using microwave oscillators
Author :
Sekar, Vikram ; Torke, William J. ; Palermo, Samuel ; Entesari, Kamran
Author_Institution :
Texas A&M Univ., College Station, TX, USA
Abstract :
In this paper, planar microwave oscillators are used to measure the dielectric constant of organic liquids for the first time. Dielectric constant of an unknown material is calculated based on the change in oscillation frequency caused by the material-under-test (MUT). A split-ring resonator (SRR) is chosen as the sensing element due its small area and high confinement of electric fields which makes it sensitive to permittivity changes of the MUT above the SRR. A C-band microwave oscillator prototype is fabricated on RT/Duroid 5880 substrate and calibrated using ethanol and methanol as reference materials. The dielectric constant of small quantities (<; 20μL) of acetic acid, xylene, isobutanol and ethyl acetate are extracted from measurement of oscillation frequency shift and show good agreement with previously reported values.
Keywords :
electric fields; frequency measurement; microwave oscillators; organic compounds; permittivity measurement; resonators; C-band microwave oscillator prototype; MUT; RT-Duroid 5880 substrate; SRR; dielectric constant measurement; electric fields; material-under-test; organic liquid; oscillation frequency; oscillation frequency measurement; planar microwave oscillator; split ring resonator; Dielectric constant; Dielectric measurements; Frequency measurement; Logic gates; Materials; Oscillators; Sensors; Permittivity measurement; microwave oscillator; split-ring resonator;
Conference_Titel :
Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-61284-754-2
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2011.5972734