DocumentCode :
2583957
Title :
A novel pulse echo correlation tool for transmission path testing and fault finding using pseudorandom binary sequences
Author :
Horan, David M. ; Guinee, Richard A.
Author_Institution :
Dept. of E lectron. Eng., Cork Inst. of Technol., Ireland
fYear :
2005
fDate :
3-5 Oct. 2005
Firstpage :
229
Lastpage :
237
Abstract :
In this paper, a novel pulse sequence testing methodology is presented as an alternative to time domain reflectometry (TDR) for transmission line ´health´ condition monitoring, faultfinding and location. This scheme uses pseudo random binary sequence (PRBS) injection with cross correlation (CCR) techniques to build a unique response profile, as a characteristic signature, to identify the type of fault, if any, or load termination present as well as its distance from the point of stimulus insertion. This fault characterization strategy can be applied to a number of industrial application scenarios embracing high frequency (HF) printed circuit board (PCB) and integrated circuit (IC) device operation, overhead lines and underground cables in inaccessible locations, which rely on a transmission line pathway or ´via´ common to all cases either for signal propagation or power conveyance. In this paper a lumped parameter circuit model is presented to emulate generalized transmission line behaviour, using the well-known pSpice simulation package, for a range of known load-terminations mimicking fault conditions in a range of application scenarios encountered in practice. Numerous line behavioural simulations for various fault conditions, known a priori, with measured CCR response demonstrate the capability of and establishes confidence in the effectiveness of the PRBS test method in fault type identification and location. The accuracy of the method is further validated through theoretical calculation using known lumped parameters, fault termination conditions and link distance in transmission line simulation.
Keywords :
binary sequences; built-in self test; cable testing; circuit testing; condition monitoring; correlation methods; equivalent circuits; fault location; high-frequency transmission lines; lumped parameter networks; cross correlation techniques; fault finding; fault identification; fault location; lumped parameter circuit model; pseudorandom binary sequences; pulse echo correlation tool; transmission line health condition monitoring; transmission path testing; Application specific integrated circuits; Binary sequences; Circuit faults; Circuit simulation; Distributed parameter circuits; Fault diagnosis; Power transmission lines; Reflectometry; Testing; Transmission line theory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2005. DFT 2005. 20th IEEE International Symposium on
ISSN :
1550-5774
Print_ISBN :
0-7695-2464-8
Type :
conf
DOI :
10.1109/DFTVS.2005.12
Filename :
1544521
Link To Document :
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