On the modeling and analysis of jitter in ATE using Matlab

Author

Kim, Kyung Ki ; Huang, Jing ; Kim, Yong-Bin ; Lombardi, Fabrizio

Author_Institution

Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA

fYear

2005

fDate

3-5 Oct. 2005

Firstpage

285

Lastpage

293

Abstract

This paper presents a new jitter component analysis method for mixed mode VLSI chip testing in automatic test equipment (ATE). The separate components are analyzed individually and then combined using Matlab. The Matlab simulation shows how jitter components combine and how the total jitter depends on the jitter injection sequence. The relationship among jitter components is presented and the superposition of the jitter components is verified. This new technique gives test engineers an insight into how the jitter components interact.

Keywords

VLSI; automatic test equipment; automatic testing; integrated circuit testing; jitter; mixed analogue-digital integrated circuits; Matlab simulation; automatic test equipment; jitter component analysis; jitter injection sequence; mixed mode VLSI chip testing; 1f noise; Automatic test equipment; Automatic testing; Electromagnetic interference; Intersymbol interference; MATLAB; Mathematical model; Probability; Timing jitter; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Defect and Fault Tolerance in VLSI Systems, 2005. DFT 2005. 20th IEEE International Symposium on

ISSN

1550-5774

Print_ISBN

0-7695-2464-8

Type

conf

DOI

10.1109/DFTVS.2005.52

Filename

1544527