DocumentCode :
258419
Title :
Testing of Memory Leak in Android Applications
Author :
Shahriar, Hossain ; North, Steve ; Mawangi, Edward
Author_Institution :
Dept. of Comput. Sci., Kennesaw State Univ., Kennesaw, GA, USA
fYear :
2014
fDate :
9-11 Jan. 2014
Firstpage :
176
Lastpage :
183
Abstract :
Android applications run on mobile devices that have limited memory resources. Although Android has its own memory manager with garbage collection support, many applications currently suffer from memory leak vulnerabilities. These applications may crash due to out of memory error while running. Testing of memory leak can detect the vulnerability early. In this paper, we perform memory leak testing of Android applications. We first develop some common memory leak patterns specific to Android applications. Then, based on the patterns, we generate test cases to emulate the memory leak. We evaluated the proposed testing approach (denoted as fuzz testing) for a number of Android applications. The initial results indicate that the proposed testing approach can effectively discover memory leaks in applications. Further, implemented code often lacks exception handling mechanism for altered resources and failed invocation of memory management related API calls.
Keywords :
Android (operating system); application program interfaces; program testing; storage management; API calls; Android applications; garbage collection support; memory leak testing; memory leak vulnerabilities; memory management; test case generation; Androids; Computer crashes; Humanoid robots; Recycling; Resource management; Smart phones; Testing; API fuzzing; Android; Appication fuzzing; Memory leak; Resource fuzzing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High-Assurance Systems Engineering (HASE), 2014 IEEE 15th International Symposium on
Conference_Location :
Miami Beach, FL
Print_ISBN :
978-1-4799-3465-2
Type :
conf
DOI :
10.1109/HASE.2014.32
Filename :
6754603
Link To Document :
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