Title :
Should Illinois-scan based architectures be centralized or distributed?
Author :
Al-Yamani, Ahmad ; Devta-Prasanna, Narendra ; Gunda, Arun
Author_Institution :
Comput. Eng., KFUPM, Dhahran, Saudi Arabia
Abstract :
This paper presents analysis of the trade off between hardware overhead, runtime, and test data volume when implementing systematic scan reconfiguration using centralized and distributed architectures of the segmented addressable scan, which is an Illinois-scan based architecture. The results show that the centralized scheme offers better data volume compression, similar ATPG runtime results and lower hardware overhead. The cost with the centralized scheme is in the routing congestion.
Keywords :
automatic test pattern generation; design for testability; fault diagnosis; logic testing; ATPG runtime results; Illinois-scan based architectures; centralized architectures; data volume compression; distributed architectures; hardware overhead; segmented addressable scan; systematic scan reconfiguration; test data volume; Circuit testing; Computer architecture; Costs; Energy consumption; Flip-flops; Hardware; Routing; Runtime; Synthetic aperture sonar; System testing;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2005. DFT 2005. 20th IEEE International Symposium on
Print_ISBN :
0-7695-2464-8
DOI :
10.1109/DFTVS.2005.59
