DocumentCode :
2584344
Title :
C-Ku band GaN MMIC T/R frontend module using multilayer ceramics technology
Author :
Masuda, Satoshi ; Yamada, Masao ; Ohki, Toshihiro ; Makiyama, Kozo ; Okamoto, Naoya ; Nakasha, Yasuhiro ; Imanishi, Kenji ; Kikkawa, Toshihide ; Shigematsu, Hisao
Author_Institution :
Fujitsu Labs. Ltd., Atsugi, Japan
fYear :
2011
fDate :
5-10 June 2011
Firstpage :
1
Lastpage :
4
Abstract :
A C-Ku band GaN monolithic microwave integrated circuit (MMIC) transmitter/receiver (T/R) frontend module with a novel RF interface structure has been successfully developed by using multilayer ceramics technology. This interface improves the insertion loss with wideband characteristics operating up to 40 GHz. The module contains a GaN power amplifier (PA) with output power higher than 10 W over 6-18 GHz and a GaN low-noise amplifier (LNA) with a gain of 15.9 dB over 3.2-20.4 GHz and noise figure (NF) of 2.3-3.7 dB over 4-18 GHz. A fabricated T/R module occupying only 12 × 30 mm2 delivers an output power of 10 W up to the Ku-band. To our knowledge, this is the first demonstration of a C-Ku band T/R frontend module using GaN MMICs with wide bandwidth, 10W output power, and small size operating up to the Ku-band.
Keywords :
III-VI semiconductors; ceramics; field effect MMIC; gallium compounds; interface structure; low noise amplifiers; microwave power amplifiers; modules; wide band gap semiconductors; C-Ku band; GaN; LNA; MMIC T-R frontend module; PA; RF interface structure; frequency 3.2 GHz to 20.4 GHz; frequency 4 GHz to 18 GHz; frequency 6 GHz to 18 GHz; gain 15.9 dB; insertion loss; low-noise amplifier; monolithic microwave integrated circuit transmitter-receiver frontend module; multilayer ceramic technology; noise figure 2.3 dB to 3.7 dB; power 10 W; power amplifier; Frequency measurement; Gallium nitride; MMICs; Microwave circuits; Noise; Power amplifiers; C-Ku band; GaN; MMIC; T/R module; low-noise amplifiers; power amplifiers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International
Conference_Location :
Baltimore, MD
ISSN :
0149-645X
Print_ISBN :
978-1-61284-754-2
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2011.5972761
Filename :
5972761
Link To Document :
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