Title :
Correlation Between Low-frequency Noise Overshoot In SOI MOSFETs And Frequency Dependence Of Floating Body Effect
Author :
Tseng, Y.-C. ; Huang, W.M. ; Babcock, J.A. ; Ford, J.M. ; Woo, J.C.S.
Author_Institution :
Department of Electrical Engineering, University of California, Los Angeles, CA 90095
Conference_Titel :
VLSI Technology, 1997. Digest of Technical Papers., 1997 Symposium on
Print_ISBN :
4-930813-75-1
DOI :
10.1109/VLSIT.1997.623714
