• DocumentCode
    2584529
  • Title

    Software-based self-test for pipelined processors: a case study

  • Author

    Hatzimihail, M. ; Xenoulis, G. ; Psarakis, M. ; Gizopoulos, D. ; Paschalis, A.

  • Author_Institution
    Dept. of Informatics, Piraeus Univ., Greece
  • fYear
    2005
  • fDate
    3-5 Oct. 2005
  • Firstpage
    535
  • Lastpage
    543
  • Abstract
    Software-based self-test (SBST) for processors and processor-based systems recently captured the interest of test technology researchers and practitioners due to its several advantages over traditional hardware built-in self-test (BIST). In this paper, we demonstrate for first time the full applicability of a recently proposed SBST methodology to a publicly available complex RISC processor implementation which includes a full pipelined architecture consisting of five pipeline stages, hazard detection, data forwarding and exceptions handling. We first show that the straightforward application of SBST routines developed for the nonpipelined version of the RISC processor can only reach a fault coverage less than 85% in the fully pipelined model. Then, we identify and classify areas with poor testability and provide solutions that extend the SBST methodology and achieve fault coverage more than 95% for this complex processor implementation.
  • Keywords
    automatic test software; built-in self test; electronic engineering computing; integrated circuit testing; microprocessor chips; pipeline processing; reduced instruction set computing; RISC processors; complex processor implementation; fault coverage; full pipelined architecture; pipelined processors; processor-based systems; software-based self-test; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Computer aided software engineering; Hardware; Hazards; Informatics; Pipelines; Reduced instruction set computing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 2005. DFT 2005. 20th IEEE International Symposium on
  • ISSN
    1550-5774
  • Print_ISBN
    0-7695-2464-8
  • Type

    conf

  • DOI
    10.1109/DFTVS.2005.63
  • Filename
    1544553