Abstract :
Contains an entry for each author and co-author included in this issue of the publication.
Keywords :
Aerospace electronics; Biographies; CMOS technology; Circuit testing; Electrostatic discharge; Integrated circuit technology; Integrated circuit testing; Pulse measurements; Reliability engineering; Test equipment;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2008. EOS/ESD 2008. 30th
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-58537-146-4
