DocumentCode
2584563
Title
Biographies
fYear
2008
fDate
7-11 Sept. 2008
Abstract
Contains an entry for each author and co-author included in this issue of the publication.
Keywords
Aerospace electronics; Biographies; CMOS technology; Circuit testing; Electrostatic discharge; Integrated circuit technology; Integrated circuit testing; Pulse measurements; Reliability engineering; Test equipment;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium, 2008. EOS/ESD 2008. 30th
Conference_Location
Tucson, AZ
Print_ISBN
978-1-58537-146-4
Type
conf
Filename
4772163
Link To Document