Title :
Characteristics of fault diagnosis for analog circuits based on preset test
Author_Institution :
Graduate Sch. of Eng., Tokyo Metropolitan Univ., Japan
Abstract :
We have proposed a method for diagnosing analog circuits, which is realized by combining the operation-region model and the X-Y zoning method. In the method, since we developed a data processing method to handle data discretely, we cloud implement a diagnosis procedure based on the preset test which is a diagnostic method for digital circuits. In this paper, we analyze results of the proposed diagnosis method by changing several parameters for diagnosing a circuit and show their characteristics. Moreover, we propose a new data processing method to obtain a short diagnostic sequence length. We demonstrate the effectiveness of the proposed method by applying it to ITC´97 benchmark circuits with hard faults and soft faults.
Keywords :
analogue circuits; circuit testing; data handling; fault diagnosis; X-Y zoning method; analog circuit diagnosis; data processing method; diagnostic sequence length; discrete data handling; fault diagnosis; integrated circuit testing; operation-region model; preset testing; Analog circuits; Circuit faults; Circuit simulation; Circuit testing; Data processing; Digital circuits; Electrical fault detection; Fault detection; Fault diagnosis; MOSFETs;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2005. DFT 2005. 20th IEEE International Symposium on
Print_ISBN :
0-7695-2464-8
DOI :
10.1109/DFTVS.2005.21