• DocumentCode
    2584624
  • Title

    A high frequency, low jitter auto-calibration phase-locked loop with built-in-self-test

  • Author

    Ali, Sadeka ; Briggs, Gregory ; Margala, Martin

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Rochester Univ., NY, USA
  • fYear
    2005
  • fDate
    3-5 Oct. 2005
  • Firstpage
    591
  • Lastpage
    599
  • Abstract
    A phase-lock loop circuit which reacts to measured jitter by adjusting the VCO input control voltage is described. This self-calibration process alters the VCO response in order to lower the jitter in its 2.4 GHz output for Bluetooth application. As this adjustment takes place, it intrinsically adjusts the VCO output towards the desired operating frequency. The programmable synthesizer has a digitally controlled VCO that provides wide tuning range of 710 MHz. The auto-calibration technique adjusts the manufacture and process variation. The synthesizer, designed in TSMC 0.18-μm technology, has an edge jitter standard deviation of 0.86-ps having a 20% improvement over PLL with no self-calibration.
  • Keywords
    UHF circuits; built-in self test; calibration; frequency synthesizers; jitter; phase locked loops; programmable circuits; voltage-controlled oscillators; 0.18 micron; 2.4 GHz; 710 MHz; Bluetooth applications; VCO input control voltage; auto-calibration technique; built-in-self-test; edge jitters; high frequency phase-locked loops; low jitter phase-locked loops; programmable synthesizer; self-calibration process; Bluetooth; Circuits; Digital control; Frequency; Jitter; Phase locked loops; Phase measurement; Synthesizers; Voltage control; Voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 2005. DFT 2005. 20th IEEE International Symposium on
  • ISSN
    1550-5774
  • Print_ISBN
    0-7695-2464-8
  • Type

    conf

  • DOI
    10.1109/DFTVS.2005.8
  • Filename
    1544559