• DocumentCode
    2584711
  • Title

    Author index

  • fYear
    2005
  • fDate
    3-5 Oct. 2005
  • Firstpage
    601
  • Lastpage
    601
  • Abstract
    The author index contains an entry for each author and coauthor included in the proceedings record.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 2005. DFT 2005. 20th IEEE International Symposium on
  • Conference_Location
    Monterey, CA
  • ISSN
    1550-5774
  • Print_ISBN
    0-7695-2464-8
  • Type

    conf

  • DOI
    10.1109/DFTVS.2005.20
  • Filename
    1544560