DocumentCode
2584711
Title
Author index
fYear
2005
fDate
3-5 Oct. 2005
Firstpage
601
Lastpage
601
Abstract
The author index contains an entry for each author and coauthor included in the proceedings record.
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 2005. DFT 2005. 20th IEEE International Symposium on
Conference_Location
Monterey, CA
ISSN
1550-5774
Print_ISBN
0-7695-2464-8
Type
conf
DOI
10.1109/DFTVS.2005.20
Filename
1544560
Link To Document