DocumentCode :
2584719
Title :
Modeling and realization of GaN-based dual-gate HEMTs and HPA MMICs for Ku-band applications
Author :
Dennler, Philippe ; Van Raay, Friedbert ; Seelmann-Eggebert, Matthias ; Quay, Rüdiger ; Ambacher, Oliver
Author_Institution :
Fraunhofer Inst. Appl. Solid-State Phys., Freiburg, Germany
fYear :
2011
fDate :
5-10 June 2011
Firstpage :
1
Lastpage :
4
Abstract :
This paper reports on linear and nonlinear modeling and realization of AlGaN/GaN dual-gate HEMTs and high power amplifier (HPA) MMICs for Ku-band applications. A method to describe the extrinsic and intrinsic parts of the dual-gate structure separated from each other using a distributed modeling approach is demonstrated. A small-signal model based on this approach was developed. A scalable nonlinear model was obtained through enhancing the small-signal model by an intrinsic large-signal state-space kernel. The excellent capabilities of both the linear and nonlinear models are demonstrated on fabricated dual-gate HEMTs with 0.25 μm gate length and a total gate width between 0.3 mm and 0.8 mm with a varying number of fingers. A 14-18 GHz, 2.5 W high power amplifier was designed and realized to illustrate the suitability of the developed models for MMIC design.
Keywords :
III-V semiconductors; MMIC power amplifiers; aluminium compounds; gallium compounds; high electron mobility transistors; integrated circuit design; semiconductor device models; wide band gap semiconductors; AlGaN-GaN; HPA MMIC design; Ku-band application; distributed modeling approach; dual-gate HEMT; frequency 14 GHz to 18 GHz; high power amplifier MMIC; intrinsic large-signal state-space kernel; nonlinear modeling; power 2.5 W; size 0.25 mum; size 0.3 mm to 0.8 mm; small-signal model; Frequency measurement; Gallium nitride; HEMTs; Integrated circuit modeling; Logic gates; MMICs; MODFETs; AlGaN/GaN; HEMTs; Ku-band; MMICs; cascode; dual-gate; large-signal modeling; power amplifiers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International
Conference_Location :
Baltimore, MD
ISSN :
0149-645X
Print_ISBN :
978-1-61284-754-2
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2011.5972785
Filename :
5972785
Link To Document :
بازگشت