DocumentCode :
2584846
Title :
Modeling a SCR-based protection structure for RF-ESD co-design simulations
Author :
Romanescu, Alexandru ; Ferrari, Philippe ; Arnould, Jean-Daniel ; Fonteneau, Pascal ; Legrand, Charles-Alexandre
Author_Institution :
LAHC, Univ. of Savoy, Grenoble, France
fYear :
2011
fDate :
5-10 June 2011
Firstpage :
1
Lastpage :
4
Abstract :
Electrostatic discharge protection is a must in every integrated circuit. At microwave frequencies, the influence the protection devices have over the circuit they protect can significantly impact the functioning of the latter. A model for the SCR (silicon controlled rectifier - one of the most efficient ESD protection devices) and the ESD protection diode was developed. Its purpose is to estimate this influence at frequencies up to 65 GHz. A complex device, the DTSCR (diode triggered SCR) is used to demonstrate the consistency of the SCR and diode models.
Keywords :
electrostatic discharge; high-frequency discharges; thyristors; DTSCR-based protection structure; Electrostatic discharge protection; RF-ESD codesign simulation; integrated circuit; microwave frequencies; silicon controlled rectifier; Capacitance; Electrostatic discharge; Integrated circuit modeling; Metals; Phase measurement; Scattering parameters; Thyristors; Electrostatic discharges; microwave measurements; modeling; overvoltage protection; simulation; thyristors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International
Conference_Location :
Baltimore, MD
ISSN :
0149-645X
Print_ISBN :
978-1-61284-754-2
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2011.5972792
Filename :
5972792
Link To Document :
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