• DocumentCode
    2585048
  • Title

    Computational Design and Optimisation of Mechanically Reinforced Masks for Stencil Lithography

  • Author

    Lishchynska, M. ; van den Boogaart, Marc A.F. ; Brugger, Juergen ; Greer, James C.

  • Author_Institution
    Tyndall Nat. Inst., Cork
  • fYear
    2007
  • fDate
    16-18 April 2007
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    Identifying, predicting and optimising stencil lithography is critical to the successful and timely development of this technique with a wide range of potential applications such as deposition on non- conventional and unstable materials (i.e. bio-chemical, hydrophobic), patterning heterostructures (epitaxial, magnetic, complex oxides, piezoelectric materials) and deposition of nanodevices onto CMOS. Previously confirmed for cantilever-like stencils is the thesis that degrading effects of stress-induced deformation of stencils can be overcome by strategic placement of corrugating structures. This approach is further exploited in this work to mechanically stabilise complex stencil designs. This involved studying the evolution of stencil deformation due to deposition induced stress and iterative design of optimal corrugation structures to be incorporated into the stencils. It is shown that degrading effects of stress-induced deformation of stencils can be significantly reduced which subsequently improves pattern definition. Reduction in deformation and in pattern distortion in the range of 50% to 96% was achieved.
  • Keywords
    deformation; finite element analysis; masks; nanolithography; nanopatterning; optimisation; computational design; deposition induced stress; finite element method; mechanically reinforced masks; optimisation; pattern distortion; stencil deformation; stencil lithography; stress-induced deformation; Biomembranes; Deformable models; Degradation; Design optimization; Fabrication; Lithography; Magnetic materials; Piezoelectric materials; Predictive models; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multi-Physics Simulation Experiments in Microelectronics and Micro-Systems, 2007. EuroSime 2007. International Conference on
  • Conference_Location
    London
  • Print_ISBN
    1-4244-1105-X
  • Electronic_ISBN
    1-4244-1106-8
  • Type

    conf

  • DOI
    10.1109/ESIME.2007.359934
  • Filename
    4201131