• DocumentCode
    2585167
  • Title

    On-Chip S-Shaped Rat-Race Balun for Millimeter-Wave Band Using Wafer-Level Chip-Size Package Process

  • Author

    Inui, Chiaki ; Manzawa, Yasuo ; Fujishima, Minoru

  • Author_Institution
    Sch. of Frontier Sci., Univ. of Tokyo, Tokyo
  • fYear
    2008
  • fDate
    27-28 Oct. 2008
  • Firstpage
    32
  • Lastpage
    35
  • Abstract
    In millimeter-wave CMOS circuits, a balun is useful for connecting off-chip single-end devices and on-chip differential circuits to improve noise immunity. However, an on-chip balun occupies large chip area. To reduce the chip area required for the on-chip balun, a new rat-race balun using rewiring technology with a wafer-level chip-size package (W-CSP) is proposed. The W-CSP balun occupies no area in a die because it is placed over integrated circuits. In the proposed balun, an S-shaped structure is adopted in order to directly connect the balun to differential GSGSG pads on a chip with small area. The S-shaped W-CSP balun was fabricated on a silicon-on-insulator (SOI) substrate. The core area of the S-shaped rat-race balun is 480 mum times 735 mum, which is 22.4% that of a square rat-race balun. As a result of measurement, we found that the minimum insertion loss is 1.7 dB and the operating frequency range is 40 to 61 GHz.
  • Keywords
    CMOS integrated circuits; MIMIC; baluns; silicon-on-insulator; wafer level packaging; SOI; insertion loss; millimeter-wave CMOS circuits; millimeter-wave band; off-chip single-end devices; on-chip S-shaped rat-race balun; on-chip differential circuits; rewiring technology; silicon-on-insulator substrate; wafer-level chip-size package; wafer-level chip-size package process; CMOS technology; Impedance matching; Integrated circuit noise; Integrated circuit packaging; Integrated circuit technology; Joining processes; Millimeter wave circuits; Millimeter wave technology; Silicon on insulator technology; Wafer scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Integrated Circuit Conference, 2008. EuMIC 2008. European
  • Conference_Location
    Amsterdam
  • Print_ISBN
    978-2-87487-007-1
  • Type

    conf

  • DOI
    10.1109/EMICC.2008.4772221
  • Filename
    4772221