DocumentCode
2585195
Title
Cumulative bibliography of articles on semiconductor thermal and temperature testing-1990
Author
Siegal, Bernard
Author_Institution
SAGE Enterprises Inc., Palo Alto, CA, USA
fYear
1990
fDate
6-8 Feb 1990
Firstpage
120
Lastpage
142
Abstract
A bibliography of articles on semiconductor thermal and/or temperature characteristics, measurement techniques and results, hardware applications, and other pertinent information is presented
Keywords
integrated circuit testing; reviews; semiconductor device testing; temperature measurement; thermal resistance measurement; bibliography; hardware applications; measurement techniques; semiconductor device temperature testing; semiconductor device thermal testing; Bibliographies; Chromium; Circuits; Electronic packaging thermal management; Inspection; Microscopy; Plastics; Semiconductor device testing; Temperature measurement; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal and Temperature Measurement Symposium, 1990. SEMI-THERM VI, Proceedings., Sixth Annual IEEE
Conference_Location
Phoenix, AZ
Type
conf
DOI
10.1109/STHERM.1990.68504
Filename
68504
Link To Document