DocumentCode :
2585270
Title :
Modeling of the mechanical behavior during programming of a non-volatile phase-change memory cell using a coupled electrical-thermal-mechanical finite-element simulator
Author :
Gille, Thomas ; Lisoni, Judit ; Goux, Ludovic ; De Meyer, Kristin ; Wouters, Dirk J.
Author_Institution :
IMEC, Leuven
fYear :
2007
fDate :
16-18 April 2007
Firstpage :
1
Lastpage :
6
Abstract :
During programming of a phase-change memory cell, the material is locally heated up to high temperatures (>600degC), to induce phase transitions as crystallization (SET) or amorphization by quenched cooling (RESET). In this work, the thermo-mechanical stresses induced in a line-type phase-change memory cell were examined using electrical-thermal-mechanical coupled finite-element simulation. Specific procedures are described, for implementing particular mechanical characteristics of the phase-change material, i.e. the volume change on crystallization, the relaxation and the phase-dependent Young moduli. Their respective effects during SET and RESET programming are investigated.
Keywords :
Young´s modulus; amorphisation; crystallisation; finite element analysis; high-temperature effects; phase change materials; random-access storage; thermomechanical treatment; PCRAM; RESET programming; SET programming; Young´s moduli; amorphization; crystallization; electrical-thermal-mechanical finite-element simulator; high temperature effects; nonvolatile phase-change memory cell; phase transitions; phase-change material; phase-change random-access memory; thermo-mechanical stresses; Cooling; Couplings; Crystalline materials; Crystallization; Finite element methods; Nonvolatile memory; Phase change memory; Temperature; Thermal stresses; Thermomechanical processes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation Experiments in Microelectronics and Micro-Systems, 2007. EuroSime 2007. International Conference on
Conference_Location :
London
Print_ISBN :
1-4244-1105-X
Electronic_ISBN :
1-4244-1106-8
Type :
conf
DOI :
10.1109/ESIME.2007.359945
Filename :
4201142
Link To Document :
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