• DocumentCode
    2585359
  • Title

    Implications from interviews to 25 Nation-Authorized Enterprise Technology Centers

  • Author

    Haoshu, Peng ; Jianhua, Yang ; Xiaoliang, Ye

  • Author_Institution
    Inst. for Sci. Commun. of China, Chinese Acad. of Sci., Beijing
  • fYear
    2008
  • fDate
    27-31 July 2008
  • Firstpage
    2296
  • Lastpage
    2304
  • Abstract
    Chinese government, academia and industries have been paying attention to technology innovation these years, especially since the concept ldquoInnovation-oriented Countryrdquo was proposed. The paper gives lessons from a study of Nation-Authorized Enterprise Technology Center (NAETC) based on interviews to 25 Nation-Authorized Enterprise Technology Centers from 17 provinces of China mainly about their R&D management, and technology transfer. Those Enterprise Technology Centers are authorized by Ministry of Science and Technology, National Development and Reform Commission, Ministry of Finance, China Customs, and State Administration of Taxation. The findings help us to understand the rules of how Chinese enterprises, especially state-owned enterprises conduct R&D and related innovation activities and to help the government in making innovation policies and decisions.
  • Keywords
    government; innovation management; organisational aspects; technology transfer; Chinese enterprises; Chinese government; NAETC; Nation-Authorized Enterprise Technology Center; R&D management; innovation-oriented country; state-owned enterprises; technology innovation; technology transfer; Companies; Government; Innovation management; Knowledge management; Paper technology; Research and development; Research and development management; Technological innovation; Technology management; Technology transfer;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Management of Engineering & Technology, 2008. PICMET 2008. Portland International Conference on
  • Conference_Location
    Cape Town
  • Print_ISBN
    978-1-890843-17-5
  • Electronic_ISBN
    978-1-890843-18-2
  • Type

    conf

  • DOI
    10.1109/PICMET.2008.4599853
  • Filename
    4599853