Title :
A fast word-level statistical estimator of intra-bus crosstalk
Author :
Gupta, Suvodeep ; Katkoori, Srinivas
Author_Institution :
Dept. of Comput. Sci. & Eng., Univ. of South Florida, Tampa, FL, USA
Abstract :
Given word-level statistics, namely mean, standard deviation, and lag-one temporal correlation of input data, we estimate the bit-level crosstalk probability on a system bus using a non-enumerative statistical approach. We introduce a sampling technique for fast evaluation of integrals during the estimation process. We had proposed two techniques previously - (a) a stream-based estimator that counts crosstalk events on a bus; and (b) a statistical enumeration technique that enumerates crosstalk-producing values on a bus and computes their occurrence probability. Both these techniques suffer from exponential time complexity with respect to the bus-width. In this work, we propose a statistical non-enumerative technique that has linear time complexity with respect to the bus-width. We achieve the linear complexity by resorting to: (1) manipulating the data stream to make the crosstalk-producing values contiguous and (2) sampling the distribution function and storing it as a lookup table. Experimental results for data streams from different data environments are presented, compared against the stream-based approach. Average errors of less than 12% are obtained for bus-widths ranging from 8b to 32b.
Keywords :
computational complexity; correlation theory; crosstalk; estimation theory; probability; sampling methods; system buses; table lookup; bitlevel crosstalk probability; exponential time complexity; intra bus crosstalk; linear time complexity; lookup table; sampling; standard deviation; statistical nonenumerative technique; stream based estimator; system bus; temporal correlation; word level statistical estimator; word level statistics; Capacitance; Crosstalk; Equations; Noise reduction; Probability; Sampling methods; Statistics; System buses; Transient analysis; Wires;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
Print_ISBN :
0-7695-2085-5
DOI :
10.1109/DATE.2004.1269041