DocumentCode :
2585462
Title :
Impact of Solder Overflow and ACLV Moisture Absorption of Mold Compound on Package Reliability
Author :
Qian, Richard ; Liu, Yong ; Irving, Scott ; Luk, Timwah
Author_Institution :
Fairchild Semicond. (Suzhou) Corp., Suzhou
fYear :
2007
fDate :
16-18 April 2007
Firstpage :
1
Lastpage :
5
Abstract :
Moisture induced die surface metal layer corrosion is a critical reliability problem which may cause eletrical failures. In this paper, the impact of solder overflow and moisture absorption of mold compound on the die surface metal layer are investigated through modeling work. Comprehensive analysis of the modeling and simulation results for die surface metal layer moisture concentration is presented. The assembly process is optimized to reduce solder overflow after the modeling. Practical tests of the solder overflow and moisture absorption factors of mold compound are carried out. Both modeling and testing have confirmed that solder overflow and mold compound´s moisture absorption have a significant impact to die surface metal layer´s moisture concentration.
Keywords :
corrosion; electronics packaging; moisture; reliability; solders; ACLV moisture absorption; assembly process; comprehensive analysis; critical reliability problem; die surface metal layer corrosion; eletrical failures; package reliability; solder overflow; Absorption; Assembly; Delamination; Finite element methods; Lead; Moisture; Packaging; Semiconductor device reliability; Testing; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation Experiments in Microelectronics and Micro-Systems, 2007. EuroSime 2007. International Conference on
Conference_Location :
London
Print_ISBN :
1-4244-1105-X
Electronic_ISBN :
1-4244-1106-8
Type :
conf
DOI :
10.1109/ESIME.2007.359956
Filename :
4201153
Link To Document :
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