Title :
X-Parameter Measurement and Simulation of a GSM Handset Amplifier
Author :
Horn, Jason M. ; Verspecht, Jan ; Gunyan, Daniel ; Betts, Loren ; Root, David E. ; Eriksson, Joakim
Author_Institution :
Agilent Technol., Inc., Santa Rosa, CA
Abstract :
X-parameters, also referred to as the parameters of the Poly-Harmonic Distortion (PHD) nonlinear behavioral model, have been introduced as the natural extension of S-parameters to nonlinear devices under large-signal drive [1]-[3]. This paper describes a new approach to X-parameter characterization and nonlinear simulation - including large-signal experimental model validation - of a commercially available GSM amplifier. A specially configured Nonlinear Vector Network Analyzer (NVNA) and procedure for measuring, for the first time, X-parameters under pulsed bias conditions is presented. The measured pulsed bias X-parameters are then used with the PHD framework to enable accurate nonlinear simulation of device behavior, including harmonics (magnitude and phase) under pulsed bias large-signal conditions with mismatch. Independent NVNA measurements validate the predictions of the X-parameter simulations of output match under drive, and show the inadequacy of "Hot S22" techniques to predict such device performance.
Keywords :
microwave integrated circuits; mobile handsets; multichip modules; nonlinear network analysis; GSM handset amplifier; S-parameters; X-parameter measurement; nonlinear vector network analyzer; poly-harmonic distortion nonlinear behavioral model; Distortion measurement; Drives; GSM; Phase measurement; Predictive models; Pulse amplifiers; Pulse measurements; Scattering parameters; Telephone sets; Time measurement;
Conference_Titel :
Microwave Integrated Circuit Conference, 2008. EuMIC 2008. European
Conference_Location :
Amsterdam
Print_ISBN :
978-2-87487-007-1
DOI :
10.1109/EMICC.2008.4772247