• DocumentCode
    2585620
  • Title

    X-Parameter Measurement and Simulation of a GSM Handset Amplifier

  • Author

    Horn, Jason M. ; Verspecht, Jan ; Gunyan, Daniel ; Betts, Loren ; Root, David E. ; Eriksson, Joakim

  • Author_Institution
    Agilent Technol., Inc., Santa Rosa, CA
  • fYear
    2008
  • fDate
    27-28 Oct. 2008
  • Firstpage
    135
  • Lastpage
    138
  • Abstract
    X-parameters, also referred to as the parameters of the Poly-Harmonic Distortion (PHD) nonlinear behavioral model, have been introduced as the natural extension of S-parameters to nonlinear devices under large-signal drive [1]-[3]. This paper describes a new approach to X-parameter characterization and nonlinear simulation - including large-signal experimental model validation - of a commercially available GSM amplifier. A specially configured Nonlinear Vector Network Analyzer (NVNA) and procedure for measuring, for the first time, X-parameters under pulsed bias conditions is presented. The measured pulsed bias X-parameters are then used with the PHD framework to enable accurate nonlinear simulation of device behavior, including harmonics (magnitude and phase) under pulsed bias large-signal conditions with mismatch. Independent NVNA measurements validate the predictions of the X-parameter simulations of output match under drive, and show the inadequacy of "Hot S22" techniques to predict such device performance.
  • Keywords
    microwave integrated circuits; mobile handsets; multichip modules; nonlinear network analysis; GSM handset amplifier; S-parameters; X-parameter measurement; nonlinear vector network analyzer; poly-harmonic distortion nonlinear behavioral model; Distortion measurement; Drives; GSM; Phase measurement; Predictive models; Pulse amplifiers; Pulse measurements; Scattering parameters; Telephone sets; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Integrated Circuit Conference, 2008. EuMIC 2008. European
  • Conference_Location
    Amsterdam
  • Print_ISBN
    978-2-87487-007-1
  • Type

    conf

  • DOI
    10.1109/EMICC.2008.4772247
  • Filename
    4772247