Industrial combining RF and system test of microwave devices using QPSK modulation

Author

Sahyoun, Walaa ; Duchamp, Jean-Marc ; Benech, Philippe

Author_Institution

IMEP-LAHC Lab., Grenoble, France

fYear

2011

fDate

5-10 June 2011

Firstpage

1

Lastpage

4

Abstract

Vector Network Analyzer is considered as the classical characterization instrument for RF-devices but it requires time, equipments and increases the cost of tested equipments. A new method is presented and suggested for industrial test of microwave devices. This procedure is based on EVM system-parameter linked to transmission S-parameter. The procedure of the test is easier and six times faster than VNA test. A single value of EVM allows knowing the functionality of the device and few points describe the RF-device characteristics. First tests were done on Butterworth filters of different orders.

Keywords

Butterworth filters; microwave devices; quadrature phase shift keying; Butterworth filters; EVM system parameter; QPSK modulation; RF-device characteristics; VNA test; microwave device; system test; transmission S-parameter; vector network analyzer; Band pass filters; Frequency measurement; Information filters; Microwave filters; Phase shift keying; Resonator filters; ADS Ptolemy simulator; EVM; QPSK; RF characterization; VNA measurements; time of test;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International

Conference_Location

Baltimore, MD

ISSN

0149-645X

Print_ISBN

978-1-61284-754-2

Electronic_ISBN

0149-645X

Type

conf

DOI

10.1109/MWSYM.2011.5972835

Filename

5972835