Dielectric parameters recognition by using a waveguide cavity and a rigorous processing algorithm

Author

Poyedinchuk, Anatoliy Ye ; Kirilenko, Anatoliy A. ; Yashina, Nataliya P.

Author_Institution

IRE, NASU, Kharkov, Ukraine

Volume

2

fYear

2002

fDate

10-13 Sept. 2002

Firstpage

482

Abstract

Measurement of scattered electromagnetic field and further permittivity or permeability reconstruction based on experimental data and adequate mathematical models is the key issue in dielectric materials study. Accuracy of measurements and adequacy of mathematical models is of principal importance. We consider a resonator that can be used for a thin film study, its electromagnetic model, and advantages and capacities of a corresponding numerical algorithm.

Keywords

cavity resonators; dielectric resonators; electromagnetic fields; permittivity; dielectric parameters recognition; electromagnetic model; permeability reconstruction; permittivity reconstruction; resonator; rigorous processing algorithm; scattered electromagnetic field; waveguide cavity; Dielectric materials; Dielectric measurements; Dielectric thin films; Electromagnetic fields; Electromagnetic measurements; Electromagnetic scattering; Electromagnetic waveguides; Mathematical model; Permeability measurement; Permittivity measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Mathematical Methods in Electromagnetic Theory, 2002. MMET '02. 2002 International Conference on

Conference_Location

Kiev, Ukraine

Print_ISBN

0-7803-7391-X

Type

conf

DOI

10.1109/MMET.2002.1106972

Filename

1106972