• DocumentCode
    2585821
  • Title

    Advanced Modeling of MISHFET Devices and their Performance in Current-Mode Class-D Power Amplifiers

  • Author

    Cumana, J. ; Lautensack, C. ; Eickelkamp, M. ; Goliasch, J. ; Noculak, A. ; Vescan, A. ; Jansen, R.H.

  • Author_Institution
    Dept. of Electromagn. Theor. (ITHE), RWTH Aachen Univ., Aachen
  • fYear
    2008
  • fDate
    27-28 Oct. 2008
  • Firstpage
    179
  • Lastpage
    182
  • Abstract
    GaN HFETs and MISHFETs are promising power devices for RF and microwave power applications. However, the performance of devices can be compromised under some operating conditions. From the device development point of view, device optimization is necessary to obtain the best possible performance. For device modeling and design purposes, the device needs to be characterized and modeled accurately in order to foresee how the device will behave under realistic operating conditions. In this paper, an improved EEHEMT1-based model for GaN MISHFETs, will be introduced. This model is capable of describing the knee region of the device´s output characteristics, dispersion effects as well as gate diode behavior accurately. The models will be incorporated in a switched-mode amplifier topology and evaluations will be made to determine the suitability of MISHFETs in these amplifiers.
  • Keywords
    HEMT integrated circuits; III-V semiconductors; MISFET; MMIC power amplifiers; current-mode circuits; field effect MMIC; gallium compounds; power HEMT; semiconductor device models; wide band gap semiconductors; EEHEMT1-based model; GaN; MISHFET devices; current-mode class-D power amplifier; device modeling; device optimization; dispersion effects; microwave power devices; switched-mode amplifier topology; Diodes; Dispersion; Gallium nitride; HEMTs; Knee; MODFETs; Microwave devices; Power amplifiers; Radio frequency; Radiofrequency amplifiers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Integrated Circuit Conference, 2008. EuMIC 2008. European
  • Conference_Location
    Amsterdam
  • Print_ISBN
    978-2-87487-007-1
  • Type

    conf

  • DOI
    10.1109/EMICC.2008.4772258
  • Filename
    4772258