• DocumentCode
    2585824
  • Title

    Technology valuation model in defense offset trade: Income approach

  • Author

    Jang, Won-Joon ; Ryu, Jin-Young

  • Author_Institution
    Defense Agency for Technol. & Quality, Seoul
  • fYear
    2008
  • fDate
    27-31 July 2008
  • Firstpage
    2521
  • Lastpage
    2534
  • Abstract
    Defense offset has been implemented by a counter-trade obligation in defense acquisition contracts between purchasing countries and foreign selling companies in the global arms market. It gives the buyer a valuable opportunity to acquire not only defense R&D technologies, but also parts production and other advantages. Even though the importance of defense offset trade is greatly increasing today, purchasing countries still need more objective and credible valuation methods by mutual agreement in defense offset contracts. Whereas the income approach is widely used for commercial fields, it is rarely applied to defense acquisition projects. This paper presents the income approach-based technology valuation model in the defense offset program of the Republic of Korea. The contribution of this paper is in the application of the defense offset valuation with income approach (DOVIN) model and its empirical implementations to defense offset contracts. It also shows several policy implications that could be applied to the defense offset program.
  • Keywords
    defence industry; international trade; purchasing; weapons; counter-trade obligation; defense R&D technology; defense acquisition contract; defense offset trade; foreign selling company; global arms market; purchasing country; technology valuation model; Africa; Arm; Cities and towns; Contracts; Cost accounting; Europe; Procurement; Production; Research and development; Technology management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Management of Engineering & Technology, 2008. PICMET 2008. Portland International Conference on
  • Conference_Location
    Cape Town
  • Print_ISBN
    978-1-890843-17-5
  • Electronic_ISBN
    978-1-890843-18-2
  • Type

    conf

  • DOI
    10.1109/PICMET.2008.4599879
  • Filename
    4599879